AS9120B, ISO 9001:2015, and FAA AC 0056B Accredited
| Item Name | Semiconductor Device Diode |
| Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC) | 5961 Semiconductor Devices and Associated Hardware |
| National Item Identification Number (NIIN) | 00-018-9193 (000189193) |
| NCB Code | USA (00) |
| Manufacturer | Motorola Inc, Howell Instruments Inc, Rockwell Collins Aerospace, On Semiconductor Corporation, State Health Services Texas, Microsemi Corporation, Infineon Technologies, International Diode Corp, Hug Electronics Corp, Burns Aerospace Corp, Lacon Electronic Gmbh, Electronic Industries Inc, Trw Electronic Components, Diodes Inc, Freescale Semiconductor Inc, Texas Instruments Inc, Semitronics Corp, American Shizuki Corporation, General Semiconductor Inc, Adelco Elektronik Gmbh, Thales Training And Simulation Inc |
| Part Number | Manufacturer | Item Name | RFQ |
|---|---|---|---|
| 1N4731 | motorola inc | semiconductor device diode | RFQ |
| CC3372 | howell instruments inc | semiconductor device diode | RFQ |
| 353-6481-070 | rockwell collins aerospace | semiconductor device diode | RFQ |
| 1N4731A | on semiconductor corporation | semiconductor device diode | RFQ |
| 1N4731 | state health services texas | semiconductor device diode | RFQ |
| 1N4731A | microsemi corporation | semiconductor device diode | RFQ |
| 1N4731A | infineon technologies | semiconductor device diode | RFQ |
| 1N4731A | international diode corp | semiconductor device diode | RFQ |
| 1N4731A | hug electronics corp | semiconductor device diode | RFQ |
| 1N4731A | burns aerospace corp | semiconductor device diode | RFQ |
| 1N4731AA | lacon electronic gmbh | semiconductor device diode | RFQ |
| 1N4731 | electronic industries inc | semiconductor device diode | RFQ |
| 1N4731A | trw electronic components | semiconductor device diode | RFQ |
| RELEASE5009 | electronic industries inc | semiconductor device diode | RFQ |
| 1N4731A | diodes inc | semiconductor device diode | RFQ |
| 1N4731A | freescale semiconductor inc | semiconductor device diode | RFQ |
| 1N4731A | texas instruments inc | semiconductor device diode | RFQ |
| 1N4731A | semitronics corp | semiconductor device diode | RFQ |
| 1N4652 | american shizuki corporation | semiconductor device diode | RFQ |
| 1N4731A | general semiconductor inc | semiconductor device diode | RFQ |
| 1N4731AA | adelco elektronik gmbh | semiconductor device diode | RFQ |
| 475316 | thales training and simulation inc | semiconductor device diode | RFQ |
| 1N4731A | electronic industries inc | semiconductor device diode | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | OVERALL LENGTH | 0.205 INCHES MAXIMUM |
| ABJT | TERMINAL LENGTH | 1.100 INCHES MINIMUM |
| ADAV | OVERALL DIAMETER | 0.100 INCHES MINIMUM AND 0.107 INCHES MAXIMUM |
| AXGY | MOUNTING METHOD | TERMINAL |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 4.3 MAXIMUM NOMINAL REGULATOR VOLTAGE |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 58.00 MILLIAMPERES MAXIMUM MAXIMUM REVERSE SURGE CURRENT |
| CTRD | POWER RATING PER CHARACTERISTIC | 1.0 WATTS MAXIMUM TOTAL POWER DISSIPATION |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 200.0 DEG CELSIUS AMBIENT AIR |
| MATT | MATERIAL | GLASS INCLOSURE |
| MATT | MATERIAL | SILICON SEMICONDUCTOR |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD |
| ZZZK | SPECIFICATION/STANDARD DATA | 80131-RELEASE5009 PROFESSIONAL/INDUSTRIAL ASSOCIATION SPECIFICATION |
| Relevant Components for NSN - 5961-00-018-9193, 5961000189193 | ||||
| 5998-01-628-9128 (5998016289128) | 5950-00-556-2628 (5950005562628) | 5910-00-502-7030 (5910005027030) | 5930-01-200-1187 (5930012001187) | |
| 5930-00-436-0040 (5930004360040) | 5998-01-022-6777 (5998010226777) | 5999-01-229-2868 (5999012292868) | 5930-00-451-8223 (5930004518223) | |
| 5980-01-237-3545 (5980012373545) | 5955-00-463-6952 (5955004636952) | 5975-01-438-5116 (5975014385116) | 5998-01-391-1476 (5998013911476) | |
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