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Item Name | Semiconductor Device Diode |
Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
Federal Supply Class (FSC) | 5961 Semiconductor Devices and Associated Hardware |
National Item Identification Number (NIIN) | 01-364-7864 (013647864) |
NCB Code | USA (01) |
Manufacturer | Powerex Inc, Military Specifications |
Part Number | Manufacturer | Item Name | RFQ |
---|---|---|---|
6022789-2(VTS | powerex inc | semiconductor device diode | RFQ |
JANTX1N3295R | military specifications | semiconductor device diode | RFQ |
MIL-PRF-19500/246 | military specifications | semiconductor device diode | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
ABHP | OVERALL LENGTH | 4.905 INCHES MINIMUM AND 5.710 INCHES MAXIMUM |
CCDG | OVERALL WIDTH ACROSS FLATS | 1.031 INCHES MINIMUM AND 1.063 INCHES MAXIMUM |
CMLP | THREAD QUANTITY PER INCH | 24 |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 1200.0 NOMINAL NONREPETITIVE PEAK REVERSE VOLTAGE AND 1000.0 NOMINAL WORKING PEAK REVERSE VOLTAGE |
THSD | THREAD SERIES DESIGNATOR | UNF |
TTQY | TERMINAL TYPE AND QUANTITY | 1 TAB,SOLDER LUG AND 1 THREADED STUD |
ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-PRF-19500/246 GOVERNMENT SPECIFICATION |
AKPV | MOUNTING FACILITY QUANTITY | 1 |
CQJX | NOMINAL THREAD SIZE | 0.375 INCHES |
MATT | MATERIAL | SILICON SEMICONDUCTOR |
ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | D0-205AA |
AXGY | MOUNTING METHOD | THREADED STUD |
CBBL | FEATURES PROVIDED | REVERSE POLARITY |
CTQX | CURRENT RATING PER CHARACTERISTIC | 100.00 AMPERES NOMINAL AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE AND 1600.00 AMPERES NOMINAL PEAK FORWARD SURGE CURRENT |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS AMBIENT AIR |
TEST | TEST DATA DOCUMENT | 81349-MIL-PRF-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLEC |
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