AS9120B, ISO 9001:2015, and FAA AC 0056B Accredited
| Item Name | Microcircuit Linear |
| Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC) | 5962 Microcircuits Electronic |
| National Item Identification Number (NIIN) | 00-197-2361 (001972361) |
| NCB Code | USA (00) |
| Manufacturer | Fairchild Semiconductor Corp, Rohde And Schwarz Inc, Adelco Elektronik Gmbh, L 3 Communications Corporation, Chelton Limited, Advanced Micro Devices Inc, Edo Corporation, Lacon Electronic Gmbh |
| Part Number | Manufacturer | Item Name | RFQ |
|---|---|---|---|
| 747HMQB | fairchild semiconductor corp | microcircuit linear | RFQ |
| 4586428 | rohde and schwarz inc | microcircuit linear | RFQ |
| 747HMQBA | adelco elektronik gmbh | microcircuit linear | RFQ |
| BL4586428 | rohde and schwarz inc | microcircuit linear | RFQ |
| 747HMQB | adelco elektronik gmbh | microcircuit linear | RFQ |
| 577-1004-01 | l 3 communications corporation | microcircuit linear | RFQ |
| B04586428 | rohde and schwarz inc | microcircuit linear | RFQ |
| 8012-10 | chelton limited | microcircuit linear | RFQ |
| 747HM | advanced micro devices inc | microcircuit linear | RFQ |
| 385945-1 | edo corporation | microcircuit linear | RFQ |
| 747HMQB | lacon electronic gmbh | microcircuit linear | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAR | BODY OUTSIDE DIAMETER | 0.335 INCHES MINIMUM AND 0.370 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.165 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 500.0 MILLIWATTS |
| AFGA | OPERATING TEMP RANGE | -55.0/125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0/150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | MONOLITHIC AND HERMETICALLY SEALED AND POSITIVE OUTPUTS AND HIGH GAIN AND INTERNALLY COMPENSATED AND NEGATIVE OUTPUTS |
| CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
| CQSZ | INCLOSURE CONFIGURATION | CAN |
| CQZP | INPUT CIRCUIT PATTERN | DUAL 2 INPUT |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-100 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| CWSG | TERMINAL SURFACE TREATMENT | TIN |
| CZEQ | TIME RATING PER CHACTERISTIC | 300.00 NANOSECONDS NOMINAL PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
| Relevant Components for NSN - 5962-00-197-2361, 5962001972361 | ||||
| 5998-01-628-9128 (5998016289128) | 5950-00-556-2628 (5950005562628) | 5910-00-502-7030 (5910005027030) | 5930-01-200-1187 (5930012001187) | |
| 5930-00-436-0040 (5930004360040) | 5998-01-022-6777 (5998010226777) | 5999-01-229-2868 (5999012292868) | 5930-00-451-8223 (5930004518223) | |
| 5980-01-237-3545 (5980012373545) | 5955-00-463-6952 (5955004636952) | 5975-01-438-5116 (5975014385116) | 5998-01-391-1476 (5998013911476) | |
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