Recently Updated NSN 5962-01-078-1814 Or (5962010781814) Part List

Item Name	Microcircuit Memory
Federal Supply Group (FSG)	Electrical and Electronic Equipment Components
Federal Supply Class (FSC)	5962 Microcircuits Electronic
National Item Identification Number (NIIN)	01-078-1814 (010781814)
NCB Code	USA (01)
Manufacturer	National Semiconductor Corporation, Intersil Corporation, Leonardo Mw Ltd, Northrop Grumman Systems Corporation, Dla Land And Maritime, Texas Instruments Inc, Raytheon Company, Advanced Micro Devices Inc, Philips Semiconductors Ltd, Thales Defense And Security Inc

Part Number	Manufacturer	Item Name	RFQ
DM54S288J 883	national semiconductor corporation	microcircuit memory	RFQ
HM1-7603-8	intersil corporation	microcircuit memory	RFQ
28721-41001	leonardo mw ltd	microcircuit memory	RFQ
058-002131-001	national semiconductor corporation	microcircuit memory	RFQ
058-002131-001	northrop grumman systems corporation	microcircuit memory	RFQ
ROM/PROM FAMILY 013	dla land and maritime	microcircuit memory	RFQ
058-002131-001	intersil corporation	microcircuit memory	RFQ
058-002131-001	texas instruments inc	microcircuit memory	RFQ
SN74S288J	texas instruments inc	microcircuit memory	RFQ
803835-1	raytheon company	microcircuit memory	RFQ
AM27S09DC	advanced micro devices inc	microcircuit memory	RFQ
S82S123F 883B	philips semiconductors ltd	microcircuit memory	RFQ
058-002131-001	philips semiconductors ltd	microcircuit memory	RFQ
058-002018	northrop grumman systems corporation	microcircuit memory	RFQ
115370-0003	thales defense and security inc	microcircuit memory	RFQ

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	0.750 INCHES MINIMUM AND 0.795 INCHES MAXIMUM
ADAT	BODY WIDTH	0.245 INCHES MINIMUM AND 0.300 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.120 INCHES MINIMUM AND 0.195 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	512.0 MILLIWATTS
AFGA	OPERATING TEMP RANGE	-55.0/125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0/150.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND SCHOTTKY AND 3-STATE OUTPUT AND W/DECODED OUTPUT AND PROGRAMMABLE AND PROGRAMMED AND W/ENABLE AND W/DISABLE
CQSJ	INCLOSURE MATERIAL	CERAMIC AND GLASS
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQWX	OUTPUT LOGIC FORM	TRANSISTOR-TRANSISTOR LOGIC
CQZP	INPUT CIRCUIT PATTERN	6 INPUT
CTFT	CASE OUTLINE SOURCE AND DESIGNATOR	-0-001-AG JOINT ELECTRON DEVICE ENGINEERING COUNCIL
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	5.5 VOLTS MAXIMUM POWER SOURCE
CZEQ	TIME RATING PER CHACTERISTIC	30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	ROM
CZZZ	MEMORY CAPACITY	UNKNOWN
TEST	TEST DATA DOCUMENT	26916-058-002131 DRAWING (THIS IS THE BASIC GOVERNING DRAWING,SUCH AS A CONTRACTOR DRAWING,ORIGINAL EQUIPMENT MANUFACTURER DRAWING,ETC.; EXCLUDES ANY SPECIFICATION,STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING D
TTQY	TERMINAL TYPE AND QUANTITY	16 FLAT LEADS