Item Name | Microcircuit Memory |
Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
Federal Supply Class (FSC) | 5962 Microcircuits Electronic |
National Item Identification Number (NIIN) | 01-199-7510 (011997510) |
NCB Code | USA (01) |
Manufacturer | Dla Land And Maritime, Eldec Corporation, Hamilton Sundstrand Corporation, Intel Corporation, Bae Systems Information, Bae Systems Inc, Raytheon Company, Edo Corporation, Seeq Technology Inc, Honeywell International Inc |
Part Number | Manufacturer | Item Name | RFQ |
---|---|---|---|
8202502YX | dla land and maritime | microcircuit memory | RFQ |
UM23-02 | eldec corporation | microcircuit memory | RFQ |
577 36 | hamilton sundstrand corporation | microcircuit memory | RFQ |
MD27128 25 B | intel corporation | microcircuit memory | RFQ |
5E8077 36 | hamilton sundstrand corporation | microcircuit memory | RFQ |
6011485-001 | bae systems information | microcircuit memory | RFQ |
312342-001 | bae systems inc | microcircuit memory | RFQ |
2690986-1 | raytheon company | microcircuit memory | RFQ |
82025 | dla land and maritime | microcircuit memory | RFQ |
433486-77 | edo corporation | microcircuit memory | RFQ |
DM27128-250 | seeq technology inc | microcircuit memory | RFQ |
8202502YA | dla land and maritime | microcircuit memory | RFQ |
8202502YB | dla land and maritime | microcircuit memory | RFQ |
6404238-1 | honeywell international inc | microcircuit memory | RFQ |
DM27128-251B | seeq technology inc | microcircuit memory | RFQ |
ROM PROM HEAD 191 | dla land and maritime | microcircuit memory | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 1.490 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.500 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.217 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND ULTRAVIOLET ERASABLE AND PROGRAMMED |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 17 INPUT |
CTQX | CURRENT RATING PER CHARACTERISTIC | 50.00 MILLIAMPERES NOMINAL SUPPLY |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.3 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
CZEQ | TIME RATING PER CHACTERISTIC | 450.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT |
CZER | MEMORY DEVICE TYPE | PROM |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
Relevant Components for NSN - 5962-01-199-7510, 5962011997510 | ||||
5998-01-628-9128 (5998016289128) | 5950-00-556-2628 (5950005562628) | 5910-00-502-7030 (5910005027030) | 5930-01-200-1187 (5930012001187) | |
5930-00-436-0040 (5930004360040) | 5998-01-022-6777 (5998010226777) | 5999-01-229-2868 (5999012292868) | 5930-00-451-8223 (5930004518223) | |
5980-01-237-3545 (5980012373545) | 5955-00-463-6952 (5955004636952) | 5975-01-438-5116 (5975014385116) | 5998-01-391-1476 (5998013911476) | |
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