Item Name | Microcircuit Memory |
Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
Federal Supply Class (FSC) | 5962 Microcircuits Electronic |
National Item Identification Number (NIIN) | 01-228-0135 (012280135) |
NCB Code | USA (01) |
Manufacturer | Raytheon Systems Ltd, Rugged Information Technology, Northrop Grumman Systems Corporation, Intel Corporation, Leonardo Mw Ltd, Datametrics Corporation, Raytheon Company, Advanced Micro Devices Inc |
Part Number | Manufacturer | Item Name | RFQ |
---|---|---|---|
MD102D20100S | raytheon systems ltd | microcircuit memory | RFQ |
760010-001 | rugged information technology | microcircuit memory | RFQ |
7141485-1 | northrop grumman systems corporation | microcircuit memory | RFQ |
MD8155H B | intel corporation | microcircuit memory | RFQ |
999 4 43076 206 | leonardo mw ltd | microcircuit memory | RFQ |
760010-001 | datametrics corporation | microcircuit memory | RFQ |
72-00906-107 | raytheon company | microcircuit memory | RFQ |
MD8155 B | intel corporation | microcircuit memory | RFQ |
AM8155DM-B | advanced micro devices inc | microcircuit memory | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 2.030 INCHES MINIMUM AND 2.080 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.515 INCHES MINIMUM AND 0.600 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.140 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 1.5 WATTS |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | HIGH PERFORMANCE AND W/ENABLE AND W/RESET AND HERMETICALLY SEALED |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 35 INPUT |
CRHL | BIT QUANTITY | 2048 |
CSWJ | WORD QUANTITY | 256 |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
CZER | MEMORY DEVICE TYPE | RAM |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 40 PRINTED CIRCUIT |
Relevant Components for NSN - 5962-01-228-0135, 5962012280135 | ||||
5998-01-628-9128 (5998016289128) | 5950-00-556-2628 (5950005562628) | 5910-00-502-7030 (5910005027030) | 5930-01-200-1187 (5930012001187) | |
5930-00-436-0040 (5930004360040) | 5998-01-022-6777 (5998010226777) | 5999-01-229-2868 (5999012292868) | 5930-00-451-8223 (5930004518223) | |
5980-01-237-3545 (5980012373545) | 5955-00-463-6952 (5955004636952) | 5975-01-438-5116 (5975014385116) | 5998-01-391-1476 (5998013911476) | |
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