Recently Updated NSN 5962-01-299-6398 Or (5962012996398) Part List

Item Name	Microcircuit Memory
Federal Supply Group (FSG)	Electrical and Electronic Equipment Components
Federal Supply Class (FSC)	5962 Microcircuits Electronic
National Item Identification Number (NIIN)	01-299-6398 (012996398)
NCB Code	USA (01)
Manufacturer	Advanced Micro Devices Inc, Seeq Technology Inc, Atmel Corporation, Raytheon Company, Northrop Grumman Systems Corporation

Part Number	Manufacturer	Item Name	RFQ
AM2817A-25 BUC	advanced micro devices inc	microcircuit memory	RFQ
LM2817A-250 B	seeq technology inc	microcircuit memory	RFQ
AT28C17 25LM 883	atmel corporation	microcircuit memory	RFQ
G278424-852	raytheon company	microcircuit memory	RFQ
058-004692-002	northrop grumman systems corporation	microcircuit memory	RFQ

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	0.540 INCHES MINIMUM AND 0.560 INCHES MAXIMUM
ADAT	BODY WIDTH	0.442 INCHES MINIMUM AND 0.458 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.054 INCHES MINIMUM AND 0.088 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	788.0 MILLIWATTS
AFGA	OPERATING TEMP RANGE	-55.0 TO 125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0 TO 150.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND W/ENABLE AND BURN IN AND PROGRAMMABLE AND ERASABLE
CQSJ	INCLOSURE MATERIAL	CERAMIC
CQSZ	INCLOSURE CONFIGURATION	LEADLESS FLAT PACK
CQWX	OUTPUT LOGIC FORM	METAL OXIDE-SEMICONDUCTOR LOGIC
CQZP	INPUT CIRCUIT PATTERN	22 INPUT
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	6.0 VOLTS MAXIMUM POWER SOURCE
CZEQ	TIME RATING PER CHACTERISTIC	250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	ROM
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
TTQY	TERMINAL TYPE AND QUANTITY	32 LEADLESS