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Item Name | Microcircuit Memory |
Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
Federal Supply Class (FSC) | 5962 Microcircuits Electronic |
National Item Identification Number (NIIN) | 01-408-0767 (014080767) |
NCB Code | USA (01) |
Manufacturer | Rockwell Collins Aerospace |
Part Number | Manufacturer | Item Name | RFQ |
---|---|---|---|
SV258-0249-010 | rockwell collins aerospace | microcircuit memory | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
CZEN | Voltage Rating And Type Per Characteristic | -0.6 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
CTQX | Current Rating Per Characteristic | 1.00 MILLIAMPERES MAXIMUM STAND-BY AND 10.00 MICROAMPERES MAXIMUM INPUT |
TTQY | Terminal Type And Quantity | 32 PRINTED CIRCUIT |
CZEP | Capitance Rating Per Characteristic | 12.00 INPUT PICOFARADS MAXIMUM AND 15.00 OUTPUT PICOFARADS MAXIMUM |
CBBL | Features Provided | BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND PROGRAMMED AND RADIATION HARDENED AND TESTED TO MIL-STD-883 AND ULTRAVIOLET ERASABLE AND W/ENABLE |
MRC | Decoded Requirement | Clear Text Reply |
AEHX | Maximum Power Dissipation Rating | 330.0 MILLIWATTS |
FEAT | Special Features | DEVICE IS A 512K X 8 CMOS UVEPROM;THIS IS AN ALTERED ITEM MADE FROM RC258-0249-010 WHICH IS SELECTED FROM 258-0249-010 WHICH IS A 67268 5962-9175202MXA (27C040);CASE OUTLINE DESIGNATOR CDIP2-T32 OR GDIP1-T32 AS DESIGNATED IN MIL-STD-1835 |
CQZP | Input Circuit Pattern | 27 INPUT |
CQSJ | Inclosure Material | CERAMIC |
TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
CWSG | Terminal Surface Treatment | SOLDER |
CQSZ | Inclosure Configuration | DUAL-IN-LINE |
AFGA | Operating Temp Range | -55.0 TO 125.0 DEG CELSIUS |
AFJQ | Storage Temp Range | -65.0 TO 150.0 DEG CELSIUS |
CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT,DIGITAL,MEMORY (HCI) |
AGAV | End Item Identification | MILSTAR |
CZEQ | Time Rating Per Chacteristic | 200.00 NANOSECONDS MAXIMUM DELAY |
CZER | Memory Device Type | PROM |
CQWX | Output Logic Form | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CRTL | Criticality Code Justification | CBBL |
Relevant Components for NSN - 5962-01-408-0767, 5962014080767 | ||||
5998-01-628-9128 (5998016289128) | 5950-00-556-2628 (5950005562628) | 5910-00-502-7030 (5910005027030) | 5930-01-200-1187 (5930012001187) | |
5930-00-436-0040 (5930004360040) | 5998-01-022-6777 (5998010226777) | 5999-01-229-2868 (5999012292868) | 5930-00-451-8223 (5930004518223) | |
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