Request a Competitive Quote for Part Number 312A1837P3 with NSN 5962013033548 by Bae Systems Controls Inc!

Part Number: 312A1837P3

Manufacturer: Bae Systems Controls Inc

NSN: 5962-01-303-3548

NIIN: 013033548

Item Name : Microcircuit Memory

CAGE Code: 89954

FSC: 5962 Microcircuits Electronic

FSG: 59 Electrical and Electronic Equipment Components

Country: USA

NCB Code: 01

Thank you for taking an interest in the top-caliber NSN products we feature here on AI NSN Parts. On this page, you can submit a quote request for part number 312A1837P3, a Microcircuit Memory item that is manufactured by Bae Systems Controls Inc. Listed alongside the NSN 5962013033548 within our database, part number 312A1837P3 is conveniently ready for purchase at any time.

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NSN Information for Part Number 312A1837P3 with NSN 5962-01-303-3548, 5962013033548

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-303-3548 Item PartTypeName: MICROCIRCUIT,MEMORY	5962	013033548	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	U		B	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
312A1837P3	5	2	3

Characteristics Data of NSN 5962-01-303-3548, 5962013033548

MRC	Criteria	Characteristic
ABKW	OVERALL HEIGHT	0.220 INCHES MINIMUM AND 0.360 INCHES MAXIMUM
ADAQ	BODY LENGTH	2.370 INCHES MINIMUM AND 2.430 INCHES MAXIMUM
ADAT	BODY WIDTH	0.550 INCHES MINIMUM AND 0.610 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.030 INCHES MINIMUM AND 0.170 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	1.0 WATTS
AFGA	OPERATING TEMP RANGE	-55.0 TO 125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0 TO 150.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	HERMETICALLY SEALED AND BURN IN AND W/ENABLE AND ELECTROSTATIC SENSITIVE AND MONOLITHIC
CQSJ	INCLOSURE MATERIAL	CERAMIC
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQWX	OUTPUT LOGIC FORM	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CQZP	INPUT CIRCUIT PATTERN	44 INPUT
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	7.0 VOLTS MAXIMUM POWER SOURCE
CZEQ	TIME RATING PER CHACTERISTIC	120.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 120.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	RAM
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
TTQY	TERMINAL TYPE AND QUANTITY	48 PRINTED CIRCUIT