Request a Competitive Quote for Part Number 99-0076 with NSN 6625012873379 by Huntron Inc!

Part Number: 99-0076

Alternate P/N: 990076

Manufacturer: Huntron Inc

NSN: 6625-01-287-3379

NIIN: 012873379

Item Name : Test Set Electronic

CAGE Code: 57705

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country: USA

NCB Code: 01

Thank you for taking an interest in the top-caliber NSN products we feature here on AI NSN Parts. On this page, you can submit a quote request for part number 99-0076, a Test Set Electronic item that is manufactured by Huntron Inc. Listed alongside the NSN 6625012873379 within our database, part number 99-0076 is conveniently ready for purchase at any time.

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To ensure listings like part number 99-0076 are ready for swift installation, we have a rigorous quality assurance program in place. As such, we make it easy for you to inquire about popular NSNs like 6625-01-287-3379, as well as the many other Huntron Inc products produced under CAGE Code 57705 that interest you. For the benefit of our customers, we carefully vet every entity that we source from, guaranteeing that you only receive superior-caliber offerings in every order. With these dedications, you can always purchase from us with confidence. Furthermore, we also organize our stock based on Federal Supply Classes, so you can find popular items under FSCs like 6625 Electrical and Electronic Properties Measuring and Testing Instruments. Do not hesitate to submit the RFQ form below, and within 15 minutes or less of submission, one of our experts will reach out with a customized solution. Get started today and see why so many customers steadily depend on AI NSN Parts for their operational needs.

Characteristics Data of NSN 6625-01-287-3379, 6625012873379

MRC	Criteria	Characteristic
TEXT	GENERAL CHARACTERISTICS ITEM DESCRIPTION	FOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT
ZZZW	DEPARTURE FROM CITED DOCUMENT	PEACETIME DEMAND OBTAIN
CXCY	III PART NAME ASSIGNED BY CONTROLLING AGENCY	TEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER