Request a Competitive Quote for Part Number IDT-6116S-90DB with NSN 5962012039749 by Integrated Device Technology Inc!

Part Number: IDT-6116S-90DB

Alternate P/N: IDT6116S90DB

Manufacturer: Integrated Device Technology Inc

NSN: 5962-01-203-9749

NIIN: 012039749

Item Name : Microcircuit Memory

CAGE Code: 61772

FSC: 5962 Microcircuits Electronic

FSG: 59 Electrical and Electronic Equipment Components

Country: USA

NCB Code: 01

Thank you for taking an interest in the top-caliber NSN products we feature here on AI NSN Parts. On this page, you can submit a quote request for part number IDT-6116S-90DB, a Microcircuit Memory item that is manufactured by Integrated Device Technology Inc. Listed alongside the NSN 5962012039749 within our database, part number IDT-6116S-90DB is conveniently ready for purchase at any time.

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NSN Information for Part Number IDT-6116S-90DB with NSN 5962-01-203-9749, 5962012039749

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-203-9749 Item PartTypeName: MICROCIRCUIT,MEMORY	5962	012039749	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	7		B	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
IDT-6116S-90DB	5	9	5

Characteristics Data of NSN 5962-01-203-9749, 5962012039749

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	1.230 INCHES MINIMUM AND 1.290 INCHES MAXIMUM
ADAT	BODY WIDTH	0.500 INCHES MINIMUM AND 0.560 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.135 INCHES MINIMUM AND 0.165 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	1.0 WATTS
AFGA	OPERATING TEMP RANGE	-55.0 TO 125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0 TO 150.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	HIGH SPEED AND HIGH PERFORMANCE AND HIGH RELIABILITY AND STATIC OPERATION AND 3-STATE OUTPUT
CQSJ	INCLOSURE MATERIAL	CERAMIC
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQWX	OUTPUT LOGIC FORM	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CQZP	INPUT CIRCUIT PATTERN	22 INPUT
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	7.0 VOLTS MAXIMUM POWER SOURCE
CZEQ	TIME RATING PER CHACTERISTIC	90.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 90.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	ROM
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
TTQY	TERMINAL TYPE AND QUANTITY	24 PRINTED CIRCUIT