Request a Competitive Quote for Part Number IDT71256S85L32B with NSN 5962013038874 by Integrated Device Technology Inc!

Part Number: IDT71256S85L32B

Manufacturer: Integrated Device Technology Inc

NSN: 5962-01-303-8874

NIIN: 013038874

Item Name : Microcircuit Memory

CAGE Code: 61772

FSC: 5962 Microcircuits Electronic

FSG: 59 Electrical and Electronic Equipment Components

Country: USA

NCB Code: 01

Thank you for taking an interest in the top-caliber NSN products we feature here on AI NSN Parts. On this page, you can submit a quote request for part number IDT71256S85L32B, a Microcircuit Memory item that is manufactured by Integrated Device Technology Inc. Listed alongside the NSN 5962013038874 within our database, part number IDT71256S85L32B is conveniently ready for purchase at any time.

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NSN Information for Part Number IDT71256S85L32B with NSN 5962-01-303-8874, 5962013038874

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-303-8874 Item PartTypeName: MICROCIRCUIT,MEMORY	5962	013038874	0	N	D
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	U		D	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
312A5165P1	2	2	3

Characteristics Data of NSN 5962-01-303-8874, 5962013038874

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	0.540 INCHES MINIMUM AND 0.560 INCHES MAXIMUM
ADAT	BODY WIDTH	0.442 INCHES MINIMUM AND 0.458 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.060 INCHES MINIMUM AND 0.120 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	1.0 WATTS
AFGA	OPERATING TEMP RANGE	-55.0 TO 125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0 TO 150.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND BURN IN AND MONOLITHIC AND STATIC OPERATION
CQSJ	INCLOSURE MATERIAL	CERAMIC
CQSZ	INCLOSURE CONFIGURATION	LEADLESS FLAT PACK
CQWX	OUTPUT LOGIC FORM	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CQZP	INPUT CIRCUIT PATTERN	26 INPUT
CTFT	CASE OUTLINE SOURCE AND DESIGNATOR	C-12 MIL-M-38510
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	7.0 VOLTS MAXIMUM POWER SOURCE
CZEQ	TIME RATING PER CHACTERISTIC	85.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 85.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	RAM
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
TTQY	TERMINAL TYPE AND QUANTITY	32 LEADLESS