Request a Competitive Quote for Part Number 8011788-2 with NSN 5962013354443 by L 3 Communications Corporation!

Part Number: 8011788-2

Alternate P/N: 80117882

Manufacturer: L 3 Communications Corporation

NSN: 5962-01-335-4443

NIIN: 013354443

Item Name : Microcircuit Memory

CAGE Code: 60225

FSC: 5962 Microcircuits Electronic

FSG: 59 Electrical and Electronic Equipment Components

Country: USA

NCB Code: 01

Thank you for taking an interest in the top-caliber NSN products we feature here on AI NSN Parts. On this page, you can submit a quote request for part number 8011788-2, a Microcircuit Memory item that is manufactured by L 3 Communications Corporation. Listed alongside the NSN 5962013354443 within our database, part number 8011788-2 is conveniently ready for purchase at any time.

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NSN Information for Part Number 8011788-2 with NSN 5962-01-335-4443, 5962013354443

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-335-4443 Item PartTypeName: MICROCIRCUIT,MEMORY	5962	013354443	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	U		B	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
8011788-2	5	2	3

Characteristics Data of NSN 5962-01-335-4443, 5962013354443

MRC	Criteria	Characteristic
ABKW	OVERALL HEIGHT	0.400 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.140 INCHES MINIMUM AND 0.185 INCHES MAXIMUM
CQWX	OUTPUT LOGIC FORM	TRANSISTOR-TRANSISTOR LOGIC
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	7.0 VOLTS MAXIMUM POWER SOURCE
TTQY	TERMINAL TYPE AND QUANTITY	16 PRINTED CIRCUIT
ADAQ	BODY LENGTH	0.840 INCHES MAXIMUM
ADAT	BODY WIDTH	0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM
AFGA	OPERATING TEMP RANGE	-55.0 TO 125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0 TO 150.0 DEG CELSIUS
CQSJ	INCLOSURE MATERIAL	CERAMIC
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
AEHX	MAXIMUM POWER DISSIPATION RATING	739.0 MILLIWATTS
CBBL	FEATURES PROVIDED	W/ACTIVE PULL-UP AND 3-STATE OUTPUT AND HIGH IMPEDANCE AND MONOLITHIC AND BIPOLAR AND SCHOTTKY AND PROGRAMMABLE
CQZP	INPUT CIRCUIT PATTERN	10 INPUT
CTFT	CASE OUTLINE SOURCE AND DESIGNATOR	D-2 MIL-M-38510
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEQ	TIME RATING PER CHACTERISTIC	75.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 75.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	ROM
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).